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Structural and physical properties of SrMn2As2
- Source :
-
Journal of Physics & Chemistry of Solids . May2011, Vol. 72 Issue 5, p457-459. 3p. - Publication Year :
- 2011
-
Abstract
- Abstract: SrMn2As2 single crystals were grown by the Sn flux method. Structural features of these crystals were characterized by means of X-ray diffraction (XRD), scanning electron microscopy (SEM) and transmission electron microscopy (TEM). The XRD results show that the single crystal has a rhombohedral structure and grows along the c-axis direction. The microstructure and layered structural features of this material have been examined by SEM and high-resolution TEM observations. The measurements of in-plane resistivity as a function of temperature demonstrate that SrMn2As2 undergoes a phase transition of semiconductor–insulator at a low temperature; the active energies are estimated to be Δ=0.64 and 0.29eV for two distinct regions. Magnetic measurements show a clear antiferromagnetic (AFM) transition at about T N =125K. Therefore, the SrMn2As2 material is an AFM insulator at low temperatures and could be a potential parent compound for superconductors. [Copyright &y& Elsevier]
Details
- Language :
- English
- ISSN :
- 00223697
- Volume :
- 72
- Issue :
- 5
- Database :
- Academic Search Index
- Journal :
- Journal of Physics & Chemistry of Solids
- Publication Type :
- Academic Journal
- Accession number :
- 60522705
- Full Text :
- https://doi.org/10.1016/j.jpcs.2010.10.053