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High-temperature yield strength and its dependence on primary creep and recovery
- Source :
-
Materials Science & Engineering: A . Jun2011, Vol. 528 Issue 16/17, p5366-5378. 13p. - Publication Year :
- 2011
-
Abstract
- Abstract: Elasto-Delayed-Elastic-Viscous (EDEV), a predictive material model for ‘quasi constant-structure’ primary creep is used in developing an algorithm for predicting stress–strain diagrams at constant strain rates. The strain rate dependence of the 0.2% offset yield-strength (σ y), time to yield, and the amounts of permanent (viscous) and the recoverable (anelastic or delayed elastic) strain components of the 0.2% offset strain can also be evaluated. Six material constants required for calculations can be obtained from short-term (few seconds to a few hours), constant-stress Strain Relaxation and Recovery Tests (SRRTs). The method is illustrated by calculations made for Ni-based fcc alloy, Waspaloy at 732°C (0.62T m) and Ti-based, alpha (hexagonal)-beta(bcc) alloy Ti-6246 at 600°C (0.45T m). In the ASTM recommended strain-rate range, 5×10−5 s−1 to 1.2×10−4 s−1, σ y increases by 6% for Waspaloy and 15% for Ti-6246. In this range, the 0.2% offset strain consists of 50% delayed elastic (anelastic) strain for Waspaloy and 70% for Ti-6246. Proportional limit is governed entirely by the delayed elastic effect or the Elasto-Delayed-Elastic (EDE) regime. Intragranular dislocation creep does not play the dominant role up to yield for the materials and temperatures considered, suggesting a shift in paradigm from conventional ideas. The EDEV model, in conjunction with SRRTs (which can be realized using a single specimen), can be used as a tool for characterizing and developing new alloys and ceramics or optimizing processing including grain-boundary engineering. [Copyright &y& Elsevier]
Details
- Language :
- English
- ISSN :
- 09215093
- Volume :
- 528
- Issue :
- 16/17
- Database :
- Academic Search Index
- Journal :
- Materials Science & Engineering: A
- Publication Type :
- Academic Journal
- Accession number :
- 60521104
- Full Text :
- https://doi.org/10.1016/j.msea.2011.03.026