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Hot-electron relaxation in ZnO films

Authors :
Yang, M.D.
Wu, S.W.
Tong, S.C.
Shu, G.W.
Liu, Y.W.
Shen, J.L.
Lan, S.M.
Wu, C.H.
Huang, Y.H.
Yang, T.N.
Source :
Thin Solid Films. Mar2011, Vol. 519 Issue 10, p3421-3424. 4p.
Publication Year :
2011

Abstract

Abstract: The energy relaxation of hot electrons in ZnO films was investigated by the electric-field-dependent photoluminescence. From the high-energy tail of photoluminescence, the electron temperature of the hot electrons in ZnO was determined. Longitudinal optical phonon emission alone cannot explain the relationship between the electron temperature and the electron energy loss rate. Instead, it can be explained by a model based on a combination of both the acoustic and longitudinal optical phonon emissions. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
00406090
Volume :
519
Issue :
10
Database :
Academic Search Index
Journal :
Thin Solid Films
Publication Type :
Academic Journal
Accession number :
59170125
Full Text :
https://doi.org/10.1016/j.tsf.2010.12.232