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Enhancement-mode AlGaN/GaN heterostructure field effect transistors fabricated by selective area growth technique.

Authors :
Wen, Yuhua
He, Zhiyuan
Li, Jialin
Luo, Ruihong
Xiang, Peng
Deng, Qingyu
Xu, Guangning
Shen, Zhen
Wu, Zhisheng
Zhang, Baijun
Jiang, Hao
Wang, Gang
Liu, Yang
Source :
Applied Physics Letters. 2/14/2011, Vol. 98 Issue 7, p072108. 3p. 1 Diagram, 1 Chart, 2 Graphs.
Publication Year :
2011

Abstract

In this letter, a method of using selective area growth (SAG) technique was proposed to fabricate the enhancement-mode (E-mode) AlGaN/GaN heterostructure field effect transistors (HFETs), which can effectively avoid the plasma treatment damage to the active region of HFETs in comparison with the conventional methods. The SAG-HFETs exhibited a good performance of the maximum drain current of 300 mA/mm and peak transconductance of 135 mS/mm with a larger positive threshold voltage of 0.4 V. The results indicate that the SAG technique is a promising method to realize the high performance E-mode GaN based HFETs. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00036951
Volume :
98
Issue :
7
Database :
Academic Search Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
58509113
Full Text :
https://doi.org/10.1063/1.3553229