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Beyond the Nernst-limit with dual-gate ZnO ion-sensitive field-effect transistors.

Authors :
Spijkman, M.
Smits, E. C. P.
Cillessen, J. F. M.
Biscarini, F.
Blom, P. W. M.
de Leeuw, D. M.
Source :
Applied Physics Letters. 1/24/2011, Vol. 98 Issue 4, p043502. 3p.
Publication Year :
2011

Abstract

The sensitivity of conventional ion-sensitive field-effect transistors (ISFETs) is limited to 59 mV/pH, which is the maximum detectable change in electrochemical potential according to the Nernst equation. Here we demonstrate a transducer based on a ZnO dual-gate field-effect transistor that breaches this boundary. To enhance the response to the pH of the electrolyte, a self-assembled monolayer has been used as a top gate dielectric. The sensitivity scales linearly with the ratio between the top and bottom gate capacitances. The sensitivity of our ZnO ISFET of 22 mV/pH is enhanced by more than two orders of magnitude up to 2.25 V/pH. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00036951
Volume :
98
Issue :
4
Database :
Academic Search Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
57656970
Full Text :
https://doi.org/10.1063/1.3546169