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Measurements of Extreme Physical Phenomena by Fourier Fringe Analysis.

Authors :
Takeda, Mitsuo
Source :
AIP Conference Proceedings. 4/15/2010, Vol. 1236 Issue 1, p445-448. 4p.
Publication Year :
2010

Abstract

The paper reviews recent applications of the Fourier transform method (FTM) of fringe pattern analysis to the measurements of extreme physical phenomena, such as those involving ultra fast optical pulses, extremely small atomic displacements, and unconventional electron or EUV waves, and shows how the advantages of FTM are exploited in these cutting edge application areas. [ABSTRACT FROM AUTHOR]

Subjects

Subjects :
*FOURIER transforms
*DIFFRACTION patterns
*METROLOGY
*ALGORITHMS
*GAS analysis
*DEFORMATIONS (Mechanics)

Details

Language :
English
ISSN :
0094243X
Volume :
1236
Issue :
1
Database :
Academic Search Index
Journal :
AIP Conference Proceedings
Publication Type :
Conference
Accession number :
55569815
Full Text :
https://doi.org/10.1063/1.3426157
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