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Synchrotron X-ray imaging of inclusions in amber

Authors :
Soriano, Carmen
Archer, Mike
Azar, Dany
Creaser, Phil
Delclòs, Xavier
Godthelp, Henk
Hand, Suzanne
Jones, Allan
Nel, André
Néraudeau, Didier
Ortega-Blanco, Jaime
Pérez-de la Fuente, Ricardo
Perrichot, Vincent
Saupe, Erin
Kraemer, Mónica Solórzano
Tafforeau, Paul
Source :
Comptes Rendus Palevol. Sep2010, Vol. 9 Issue 6/7, p361-368. 8p.
Publication Year :
2010

Abstract

Abstract: Over the past six years, organic inclusions preserved in amber samples from outcrops worldwide have been discovered and imaged in 3D using propagation phase contrast based X-ray synchrotron imaging techniques at the European Synchrotron Radiation Facility (ESRF). A brief description of the techniques and protocols used for detecting and 3D non-destructive imaging of amber inclusions is provided. The latest results from the major amber projects in the ESRF are given, illustrating the increasing utility of the imaging capabilities of X-ray synchrotron phase contrast microtomography. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
16310683
Volume :
9
Issue :
6/7
Database :
Academic Search Index
Journal :
Comptes Rendus Palevol
Publication Type :
Academic Journal
Accession number :
55501340
Full Text :
https://doi.org/10.1016/j.crpv.2010.07.014