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FEI Introduces Nova NanoSEM 50 Series.
- Source :
-
Electronic Device Failure Analysis . Nov2010, Vol. 12 Issue 4, p40-42. 2p. - Publication Year :
- 2010
-
Abstract
- The article reports that FEI Co. has announced the availability of its NovaNanoSEM 50 Series of ultrahigh-resolution scanning electron microscopes. It states that the product is designed to provide industry-leading, nanometer-scale resolution and precise analysis on a wide range of samples. It adds that the NovaNanoSEM 50 Series adds technological innovations from industry-leading products of FEI.
Details
- Language :
- English
- ISSN :
- 15370755
- Volume :
- 12
- Issue :
- 4
- Database :
- Academic Search Index
- Journal :
- Electronic Device Failure Analysis
- Publication Type :
- Academic Journal
- Accession number :
- 54905726