Study of extrinsic interface states at the AL/Si interface from capacitance-voltage characteristics.

Studies the frequency-dependent current-voltage characteristics of water treated Al/Si(n) junctions. Preparation of Al/Si interfaces; Extrinsic interface state capacitance at the Al/Si interface; Quantitative estimation of the density of states, energies in the forbidden gap of the semiconductors and capture cross-section for the states; Charge exchange between the interface states and the conduction band.