A Union of Embedded Test Expertise.

The article focuses on the standards that govern the use of embedded test instruments. The author discusses the Institute of Electrical and Electronics Engineers (IEEE) 1149.1 standard test access port (TAP) standards also called the JTAG after the Joint Test Action Group that was developed to achieve high fault coverage. He also mentions the efforts of the JTAG working group or the P1687 in introducing the standard.