Relationship between intrinsic surface resistance and critical current density of YBCO thin films with various thickness

Abstract: We investigated the relationship between the intrinsic surface resistance () and critical current density (J c) of YBa2Cu3Oy (YBCO) film thinner than the penetration depth (λ L). The measured YBCO films were deposited on CeO2-buffered r-cut Al2O3 substrates by the pulsed laser deposition method. The thicknesses of these films were 300, 200, and 100nm, respectively. The means the surface resistance of YBCO film removing the loss by the impedance of the substrates. The effective surface resistance () including the impedance of the substrate and the J c of each YBCO film were measured using the dielectric resonator method at 21.8GHz and the inductive method. We calculated by using phenomenological expressions and the value. The values of each YBCO film were almost the same in the measured temperature region. As a result, we found that was in inverse proportion to the J c of YBCO film thinner than λ L. [ABSTRACT FROM AUTHOR]