Cite
Depth Profiling of Nanometer Coatings by Low Temperature Plasma Probe Combined with Inductively Coupled Plasma Mass Spectrometry.
MLA
Zhi Xing, et al. “Depth Profiling of Nanometer Coatings by Low Temperature Plasma Probe Combined with Inductively Coupled Plasma Mass Spectrometry.” Analytical Chemistry, vol. 82, no. 13, July 2010, pp. 5872–77. EBSCOhost, https://doi.org/10.1021/ac101147t.
APA
Zhi Xing, Juan Wang, Guojun Han, Biekesailike Kuermaiti, Sichun Zhang, & Xinrong Zhang. (2010). Depth Profiling of Nanometer Coatings by Low Temperature Plasma Probe Combined with Inductively Coupled Plasma Mass Spectrometry. Analytical Chemistry, 82(13), 5872–5877. https://doi.org/10.1021/ac101147t
Chicago
Zhi Xing, Juan Wang, Guojun Han, Biekesailike Kuermaiti, Sichun Zhang, and Xinrong Zhang. 2010. “Depth Profiling of Nanometer Coatings by Low Temperature Plasma Probe Combined with Inductively Coupled Plasma Mass Spectrometry.” Analytical Chemistry 82 (13): 5872–77. doi:10.1021/ac101147t.