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Integrating Circuit Level Simulation and Monte-Carlo Radiation Transport Code for Single Event Upset Analysis in SEU Hardened Circuitry.
- Source :
-
IEEE Transactions on Nuclear Science . Dec2008 Part 1 of 2, Vol. 55 Issue 6, p2886-2894. 9p. 6 Diagrams, 2 Charts, 7 Graphs. - Publication Year :
- 2008
-
Abstract
- Monte-Carlo radiation transport code is coupled with SPICE circuit level simulation to identify regions of single event upset vulnerability in an SEU hardened flip-flop, as well as predict single event upset cross sections and on-orbit soft error rates under static and dynamic operating conditions. [ABSTRACT FROM PUBLISHER]
Details
- Language :
- English
- ISSN :
- 00189499
- Volume :
- 55
- Issue :
- 6
- Database :
- Academic Search Index
- Journal :
- IEEE Transactions on Nuclear Science
- Publication Type :
- Academic Journal
- Accession number :
- 52037608
- Full Text :
- https://doi.org/10.1109/TNS.2008.2006481