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Beamline Reconfiguring and Commissioning for X-Ray Microdiffraction Experiments.

Authors :
Gil, K. H.
Lim, J.
Choi, H. J.
Ahn, S. J.
Bark, C. W.
Lim, J. H.
Huang, J. Y.
Source :
AIP Conference Proceedings. 6/24/2010, Vol. 1234 Issue 1, p339-342. 4p. 1 Color Photograph, 3 Diagrams, 1 Graph.
Publication Year :
2010

Abstract

The 5C1 beamline at Pohang Light Source (PLS) was reconfigured into a beamline for X-ray microdiffraction (XMD) experiments through works during the year 2008 and has been commissioned recently. A slit, two ionization chambers, a shutter, a monochromator, a Kirkpatrick-Baez (K-B) mirror system, a sample stage assembly, and an X-ray CCD detector were newly installed and a series of LabVIEW applications to control these experimental equipments and to execute the data acquisition was completed. After the alignment of the equipments, a 100 μm×100 μm beam defined by the slit was focused down to less than 3 μm in the horizontal and vertical planes by a pair of vertically and horizontally focusing mirrors. Then, the X-ray CCD detector took test diffraction images of a Ge single crystal on the sample holder of the sample stage assembly. The paper describes the details of the equipments and several new improvements of the new 5C1 beamline, reports the processes and results of the commissioning work, and shows the experimental performance expected from the diffraction images. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
0094243X
Volume :
1234
Issue :
1
Database :
Academic Search Index
Journal :
AIP Conference Proceedings
Publication Type :
Conference
Accession number :
51975493
Full Text :
https://doi.org/10.1063/1.3463206