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Overview of the SPring-8 Diagnostics Beamlines.
- Source :
-
AIP Conference Proceedings . 6/24/2010, Vol. 1234 Issue 1, p399-402. 4p. 3 Diagrams. - Publication Year :
- 2010
-
Abstract
- We present an overview of the two SPring-8 diagnostics beamlines, the beamline I (dipole magnet source) and II (insertion device source). At the beamline I, synchrotron radiation (SR) in both the X-ray and the visible bands is exploited for characterizations of the electron beam. At the beamline II, by observing the spectral, spatial, and temporal characteristics of X-ray SR of the insertion device (ID), new techniques for accelerator diagnostics are investigated. Irradiation experiments with the ID to develop accelerator components such as photon absorbers, and production of intensive 10 MeV γ-rays by backward Compton scattering of external far infrared (FIR) laser photons are being prepared at the beamline II. [ABSTRACT FROM AUTHOR]
- Subjects :
- *ELECTRON beams
*ELECTRONICS
*ELECTRON optics
*X-rays
*SCATTERING (Physics)
Subjects
Details
- Language :
- English
- ISSN :
- 0094243X
- Volume :
- 1234
- Issue :
- 1
- Database :
- Academic Search Index
- Journal :
- AIP Conference Proceedings
- Publication Type :
- Conference
- Accession number :
- 51975476
- Full Text :
- https://doi.org/10.1063/1.3463223