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Fabrication of system with probe for high-frequency measurement applications.
- Source :
-
Microwave & Optical Technology Letters . Sep2010, Vol. 52 Issue 9, p2083-2087. 5p. 1 Color Photograph, 1 Diagram, 3 Graphs. - Publication Year :
- 2010
-
Abstract
- In this study, a new type of low temperature co-fired ceramic (LTCC) probes fabricated using the system-in-package (SiP) technology is proposed; these probes are used for high-frequency measurements. The advantage of LTCC probes is that suitable structures of the metal tips of their electrodes can be easily created by cutting LTCC sheets during the fabrication process. © 2010 Wiley Periodicals, Inc. Microwave Opt Technol Lett 52: 2083–2087, 2010; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.25416 [ABSTRACT FROM AUTHOR]
- Subjects :
- *CERAMICS
*ELECTRODES
*ELECTRIC impedance
*PERMITTIVITY
*ELECTRIC resistance
Subjects
Details
- Language :
- English
- ISSN :
- 08952477
- Volume :
- 52
- Issue :
- 9
- Database :
- Academic Search Index
- Journal :
- Microwave & Optical Technology Letters
- Publication Type :
- Academic Journal
- Accession number :
- 51600296
- Full Text :
- https://doi.org/10.1002/mop.25416