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THE TEST FLOOR.

Authors :
Chappell, Jeff
Source :
Electronic News. 9/10/2001, Vol. 47 Issue 37, p34. 1/6p.
Publication Year :
2001

Abstract

Presents news on the electronic circuits testing equipment industry as of September 10, 2001. Information on the vertical-cavity surface-emitting laser wafer probe system for wafer characterization from Karl Suss America Inc. and Labsphere Inc.; Net sales posted by test and assembly house ASAT Holdings Ltd. for the first quarter of 2002.

Details

Language :
English
ISSN :
10616624
Volume :
47
Issue :
37
Database :
Academic Search Index
Journal :
Electronic News
Publication Type :
Periodical
Accession number :
5157064