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Off-axis and inline electron holography: A quantitative comparison
- Source :
-
Ultramicroscopy . Apr2010, Vol. 110 Issue 5, p460-471. 12p. - Publication Year :
- 2010
-
Abstract
- Abstract: Capable of quantitatively imaging static magnetic and electric potentials and even strain electron holography is a very versatile and powerful TEM technique. In this paper we compare off-axis electron holography with a recently developed focal series reconstruction algorithm and phase retrieval based on the transport of intensity equation. Based on theoretical considerations and simulations we compare the different techniques with respect to parameters such as the coherence requirements, field of view, resolution, noise properties, and other required experimental conditions. [Copyright &y& Elsevier]
Details
- Language :
- English
- ISSN :
- 03043991
- Volume :
- 110
- Issue :
- 5
- Database :
- Academic Search Index
- Journal :
- Ultramicroscopy
- Publication Type :
- Academic Journal
- Accession number :
- 49856279
- Full Text :
- https://doi.org/10.1016/j.ultramic.2009.11.022