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Off-axis and inline electron holography: A quantitative comparison

Authors :
Koch, Christoph T.
Lubk, Axel
Source :
Ultramicroscopy. Apr2010, Vol. 110 Issue 5, p460-471. 12p.
Publication Year :
2010

Abstract

Abstract: Capable of quantitatively imaging static magnetic and electric potentials and even strain electron holography is a very versatile and powerful TEM technique. In this paper we compare off-axis electron holography with a recently developed focal series reconstruction algorithm and phase retrieval based on the transport of intensity equation. Based on theoretical considerations and simulations we compare the different techniques with respect to parameters such as the coherence requirements, field of view, resolution, noise properties, and other required experimental conditions. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
03043991
Volume :
110
Issue :
5
Database :
Academic Search Index
Journal :
Ultramicroscopy
Publication Type :
Academic Journal
Accession number :
49856279
Full Text :
https://doi.org/10.1016/j.ultramic.2009.11.022