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Edge-enhanced imaging obtained with very broad energy band x-rays.
- Source :
-
Applied Physics Letters . 4/5/2010, Vol. 96 Issue 14, p144102. 3p. 1 Color Photograph, 1 Diagram, 4 Graphs. - Publication Year :
- 2010
-
Abstract
- We demonstrate both theoretically and experimentally that edge-enhancement effects are produced when objects, in contact with the x-ray detector, are imaged by using very broad x-ray spectra. Radiographs of thin Al objects have been obtained with a table-top synchrotron source which generates x-rays in the energy range from a few kilo-electron-volts up to 6 MeV. Edge-enhancement effects arise from the combination of x-ray absorption (kilo-electron-volt part of the spectrum) and secondary particle emission (mega-electron-volt part of the spectrum) within the sample. The exact contribution of absorption and emission profiles in the edge-enhanced images has been calculated via Monte Carlo simulation. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 96
- Issue :
- 14
- Database :
- Academic Search Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 49071254
- Full Text :
- https://doi.org/10.1063/1.3380641