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Full Field Nanoimprint on Mask Aligners Using Substrate Conformal Imprint Lithography Technique.

Authors :
Ran Ji
Krüger, A.
Hornung, M.
Verschuuren, M.
van de Laar, R.
van Eekelen, J.
Source :
Acta Physica Polonica: A. Dec2009 Supplement, Vol. 116, pS.187-S.189. 3p. 2 Color Photographs, 1 Black and White Photograph.
Publication Year :
2009

Abstract

The article discusses the study which discovered the nanoimprint lithography (NIL) technique called substrate conformal imprint lithography (SCIL) using the equivalent tools on mask aligners from Suss MiroTec AG . It notes that the SCIL process can provide a larger area for imprinting with minimized resolutions. It implies that the SCIL technique can offer the potential reliability and efficiency in high volume production of patterned media storage and high brightness applications using light emitting diodes (LEDs).

Details

Language :
English
ISSN :
05874246
Volume :
116
Database :
Academic Search Index
Journal :
Acta Physica Polonica: A
Publication Type :
Academic Journal
Accession number :
48924741
Full Text :
https://doi.org/10.12693/APhysPolA.116.S-187