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Microscopic nature of Staebler-Wronski defect formation in amorphous silicon.

Authors :
Biswas, R.
Pan, B. C.
Source :
Applied Physics Letters. 1/19/1998, Vol. 72 Issue 3. 3 Diagrams, 1 Chart, 1 Graph.
Publication Year :
1998

Abstract

Light-induced metastable defects in a-Si:H are proposed to be silicon dangling bonds accompanied by pairs of hydrogen atoms breaking a silicon bond, forming a complex with two Si-H bonds. This supports the model of Branz. These defects are the analog of the H[sub 2][sup *] defect in c-Si and their energy correlates with the bond-angle strain. Several features of the annealing are well described by this defect complex. © 1998 American Institute of Physics. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00036951
Volume :
72
Issue :
3
Database :
Academic Search Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
4872823
Full Text :
https://doi.org/10.1063/1.120740