UNDER THE LID.

The article discusses the costs and various digital and analog methods of testing integrated circuits (IC). While the cost of automatic-test-pattern generation (ATPB), built-in self-tests (BIST) and structural techniques have been under control, analog complexity continues to raise the cost of testing analog and mixed-signal (AMS) circuits. Analog testing strategies include characterization, the use of BISTs and structural testing. Adaptive testing involves the use of statistical analysis of production test data.