Ultrafast structural changes measured by time-resolved X-ray diffraction.

Authors :: Larsson, J.
Heimann, P.A.
Lindenberg, A.M.
Schuck, P.J.
Bucksbaum, P.H.
Lee, R.W.
Padmore, H.A.
Wark, J.S.
Falcone, R.W.
Source :: Applied Physics A: Materials Science & Processing. 1998, Vol. 66 Issue 6, p587. 5p.
Publication Year :: 1998
Abstract: Abstract. High-intensity X-ray pulses from third-generation synchrotron sources make it possible to study the temporal dynamics of rapidly evolving materials. We report a study of rapid and reversible disordering of the structure of an InSb crystal induced by an ultrashort laser pulse. A novel crosscorrelation detection technique is described, which allowed us to observe rapid changes in X-ray diffraction that occur on a time-scale of less than 2 ps. [ABSTRACT FROM AUTHOR]