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Structure and dielectric properties of cubic Bi2(Zn1/3Ta2/3)2O7 thin films.

Authors :
Noh, Jun Hong
Hong, Hee Beom
Lee, Jung-Kun
Cho, Chin Moo
Kim, Jin Young
Lee, Sangwook
Cho, In-Sun
Jung, Hyun Suk
Hong, Kug Sun
Source :
Journal of Applied Physics. Oct2009, Vol. 106 Issue 8, p084103-084107. 4p. 1 Black and White Photograph, 2 Charts, 4 Graphs.
Publication Year :
2009

Abstract

Pyrochlore Bi2(Zn1/3Ta2/3)2O7 (BZT) films were prepared by pulsed laser deposition on Pt/TiO2/SiO2/Si substrates. In contrast to bulk monoclinic BZT ceramics, the BZT films have a cubic structure mediated by an interfacial layer. The dielectric properties of the cubic BZT films [[variant_greek_epsilon]∼177, temperature coefficient of capacitance (TCC) ∼-170 ppm/°C] are much different from those of monoclinic BZT ceramics ([variant_greek_epsilon]∼61, TCC ∼+60 ppm/°C). Increasing the thickness of the BZT films returns the crystal structure to the monoclinic phase, which allows the dielectric properties of the BZT films to be tuned without changing their chemical composition. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218979
Volume :
106
Issue :
8
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
44909663
Full Text :
https://doi.org/10.1063/1.3246807