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Structure and dielectric properties of cubic Bi2(Zn1/3Ta2/3)2O7 thin films.
- Source :
-
Journal of Applied Physics . Oct2009, Vol. 106 Issue 8, p084103-084107. 4p. 1 Black and White Photograph, 2 Charts, 4 Graphs. - Publication Year :
- 2009
-
Abstract
- Pyrochlore Bi2(Zn1/3Ta2/3)2O7 (BZT) films were prepared by pulsed laser deposition on Pt/TiO2/SiO2/Si substrates. In contrast to bulk monoclinic BZT ceramics, the BZT films have a cubic structure mediated by an interfacial layer. The dielectric properties of the cubic BZT films [[variant_greek_epsilon]∼177, temperature coefficient of capacitance (TCC) ∼-170 ppm/°C] are much different from those of monoclinic BZT ceramics ([variant_greek_epsilon]∼61, TCC ∼+60 ppm/°C). Increasing the thickness of the BZT films returns the crystal structure to the monoclinic phase, which allows the dielectric properties of the BZT films to be tuned without changing their chemical composition. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 106
- Issue :
- 8
- Database :
- Academic Search Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 44909663
- Full Text :
- https://doi.org/10.1063/1.3246807