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Direct evidence of spontaneous quantum dot formation in a thick InGaN epilayer.

Authors :
Nistor, L.
Bender, H.
Vantomme, A.
Wu, M. F.
Wu, M.F.
Van Landuyt, J.
O'Donnell, K. P.
O'Donnell, K.P.
Martin, R.
Jacobs, K.
Moerman, I.
Source :
Applied Physics Letters. 7/24/2000, Vol. 77 Issue 4.
Publication Year :
2000

Abstract

We report a direct observation of quantum dots formed spontaneously in a thick InGaN epilayer by high resolution transmission electron microscopy. Investigation of a (280 nm thick) In[sub 0.22]Ga[sub 0.78]N single layer, emitting in the blue/green spectral region, reveals quantum dots with estimated sizes in the range of 1.5-3 nm. Such sizes are in very good agreement with calculations based on the luminescence spectra of this specimen. © 2000 American Institute of Physics. [ABSTRACT FROM AUTHOR]

Subjects

Subjects :
*QUANTUM dots
*ELECTRON microscopy

Details

Language :
English
ISSN :
00036951
Volume :
77
Issue :
4
Database :
Academic Search Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
4414806
Full Text :
https://doi.org/10.1063/1.127026