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Electrochemically etched nickel tips for spin polarized scanning tunneling microscopy.
- Source :
-
Review of Scientific Instruments . Dec2000, Vol. 71 Issue 12. - Publication Year :
- 2000
-
Abstract
- A fast and simple method for the electrochemical preparation of sharp Ni tips for spin polarized scanning tunneling microscopy (STM) is reported. These Ni tips perform well also in conventional STM experiments, being able to achieve reproducible atomic resolution on graphite. Ni tips combine the advantages of both Pt/Ir tips, since they are oxide free, and of W tips because of the greater reproducibility and control of the tip apex by means of the etching protocol, as compared to freshly cut tips. © 2000 American Institute of Physics. [ABSTRACT FROM AUTHOR]
- Subjects :
- *SCANNING tunneling microscopy
*NICKEL
Subjects
Details
- Language :
- English
- ISSN :
- 00346748
- Volume :
- 71
- Issue :
- 12
- Database :
- Academic Search Index
- Journal :
- Review of Scientific Instruments
- Publication Type :
- Academic Journal
- Accession number :
- 4409547
- Full Text :
- https://doi.org/10.1063/1.1311936