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ToF-SIMS depth profile of the surface film on pure magnesium formed by immersion in pure water and the identification of magnesium hydride
- Source :
-
Corrosion Science . Sep2009, Vol. 51 Issue 9, p1883-1886. 4p. - Publication Year :
- 2009
-
Abstract
- Abstract: Time of Flight-Secondary Ion Mass Spectrometry (ToF-SIMS) was used to examine the film formed on pure magnesium by immersion for 2min in ultra pure water. The ToF-SIMS data indicates that there is magnesium hydride within the surface film. The presence of MgH2 is a result of the Mg corrosion mechanism. [Copyright &y& Elsevier]
Details
- Language :
- English
- ISSN :
- 0010938X
- Volume :
- 51
- Issue :
- 9
- Database :
- Academic Search Index
- Journal :
- Corrosion Science
- Publication Type :
- Academic Journal
- Accession number :
- 43652609
- Full Text :
- https://doi.org/10.1016/j.corsci.2009.06.002