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Bonding configuration and defects in amorphous SiN[sub x]:H films.
- Source :
-
Applied Physics Letters . 2/18/1991, Vol. 58 Issue 7, p741. 3p. 1 Chart, 4 Graphs. - Publication Year :
- 1991
-
Abstract
- Investigates the bonding configuration and defects in amorphous SiN[sub x]:H films. Maximum of the slope in the Urbach form of the absorption coefficient; Examination of the random-bonding model including hydrogen atoms.
- Subjects :
- *THIN films
*DIFFUSION bonding (Metals)
Subjects
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 58
- Issue :
- 7
- Database :
- Academic Search Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 4330519
- Full Text :
- https://doi.org/10.1063/1.104533