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Optically detected Auger recombination in erbium- and ytterbium-doped InP.

Authors :
Liesert, B.J. Heijmink
Godlewski, M.
Gregorkiewicz, T.
Ammerlaan, C.A.J.
Source :
Applied Physics Letters. 12/16/1991, Vol. 59 Issue 25, p3279. 3p. 4 Graphs.
Publication Year :
1991

Abstract

Examines microwave-induced impact ionization of excitons and shallow donors in Er- and Yb-doped InP. Efficiency of rare-earth photoluminescence; Use of sample grown by metalorganic chemical vapor deposition; Spectral dependence of the impact ionization spectra.

Subjects

Subjects :
*IONIZATION (Atomic physics)
*DOPED semiconductors
*PHOTOLUMINESCENCE

Details

Language :
English
ISSN :
00036951
Volume :
59
Issue :
25
Database :
Academic Search Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
4329324
Full Text :
https://doi.org/10.1063/1.105705
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