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Real time electron microscopy inspection of high temperature processes in W free standing wires.

Authors :
Gomez-Herrero, J.
Pascual, J.I.
Mendez, J.
Baro, A.M.
Source :
Applied Physics Letters. 3/8/1993, Vol. 62 Issue 10, p1077. 3p. 6 Black and White Photographs, 1 Diagram, 1 Graph.
Publication Year :
1993

Abstract

Examines the use of real time electron microscopy in inspecting high temperature processes in tungsten free standing wires (FSW). Efficiency of fabricated FSW in investigating quantum mechanics phenomena; Usage of electrochemical etching in fabricating tungsten FSW; Effect of strong thermal gradient on migration mechanisms.

Subjects

Subjects :
*ELECTRON microscopy
*HIGH temperatures
*TUNGSTEN
*CHROMIUM wire

Details

Language :
English
ISSN :
00036951
Volume :
62
Issue :
10
Database :
Academic Search Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
4322997

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