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High-resolution transmission electron microscopic study of the gamma-FeSi[sub 2]/Si(111) interface.
- Source :
-
Applied Physics Letters . 4/11/1994, Vol. 64 Issue 15, p1938. 3p. 2 Black and White Photographs, 4 Diagrams. - Publication Year :
- 1994
-
Abstract
- Determines the atomic structure of the B-type gamma-FeSi[sub 2]//Si(111) interfaces by high-resolution transmission electron microscopy. Combination of dynamical calculations of the image contrast in the study; Agreement of one interface model with observations; Attachment of Fe atoms to the substrate silicon atoms.
- Subjects :
- *ATOMIC structure
*CRYSTALLINE interfaces
*TRANSMISSION electron microscopy
Subjects
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 64
- Issue :
- 15
- Database :
- Academic Search Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 4272468