Back to Search Start Over

Transmission electron diffraction study of C70 phase transformation at low temperature.

Authors :
Tomita, M.
Hayashi, T.
Source :
Applied Physics Letters. 9/7/1992, Vol. 61 Issue 10, p1171. 3p. 4 Diagrams.
Publication Year :
1992

Abstract

Observes the phase transmission of C70 crystal by transmission electron microscopy at low temperature. Index of the spots appearing in the electron diffraction (ED); Measurement of the lattice constant a; Estimation of the ED of the low-temperature phase; Detection of an intermediate state in the temperature range.

Details

Language :
English
ISSN :
00036951
Volume :
61
Issue :
10
Database :
Academic Search Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
4232983
Full Text :
https://doi.org/10.1063/1.107636