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Computed laminography for materials testing.
- Source :
-
Applied Physics Letters . 6/10/1996, Vol. 68 Issue 24, p3500. 3p. 5 Black and White Photographs, 3 Diagrams. - Publication Year :
- 1996
-
Abstract
- Develops a computed laminography system for inspecting large or flat objects using x-rays. Necessity of object translation in the method; Basis for reconstruction of object cross sections; Use of a microfocus x-ray tube and line detector for object inspection with 50 micrometer slice resolution.
- Subjects :
- *MATERIALS testing
*X-rays
*OPTICAL resolution
Subjects
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 68
- Issue :
- 24
- Database :
- Academic Search Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 4208901
- Full Text :
- https://doi.org/10.1063/1.115771