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Computed laminography for materials testing.

Authors :
Zhou, J.
Maisl, M.
Source :
Applied Physics Letters. 6/10/1996, Vol. 68 Issue 24, p3500. 3p. 5 Black and White Photographs, 3 Diagrams.
Publication Year :
1996

Abstract

Develops a computed laminography system for inspecting large or flat objects using x-rays. Necessity of object translation in the method; Basis for reconstruction of object cross sections; Use of a microfocus x-ray tube and line detector for object inspection with 50 micrometer slice resolution.

Details

Language :
English
ISSN :
00036951
Volume :
68
Issue :
24
Database :
Academic Search Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
4208901
Full Text :
https://doi.org/10.1063/1.115771