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Surface morphology in InAs/GaAs(111)A heteroepitaxy: Experimental measurements and computer...
- Source :
-
Applied Physics Letters . 8/9/1999, Vol. 75 Issue 6, p829. 3p. 3 Black and White Photographs, 2 Graphs. - Publication Year :
- 1999
-
Abstract
- Examines the surface morphology of indium films by scanning tunneling microscopy. Vertical surface displacement on the films; Atomistic simulations within a valence force field model; Misfit dislocation network at the semicoherent interface.
- Subjects :
- *INDIUM compounds
*THIN films
*SCANNING tunneling microscopy
Subjects
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 75
- Issue :
- 6
- Database :
- Academic Search Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 4200285
- Full Text :
- https://doi.org/10.1063/1.124527