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Electrical stress-induced variable range hopping conduction in ultrathin silicon dioxides.
- Source :
-
Applied Physics Letters . 1/20/1997, Vol. 70 Issue 3, p351. 3p. 5 Graphs. - Publication Year :
- 1997
-
Abstract
- Investigates the electrical stress-induced variable range hopping conduction in ultrathin silicon dioxides. Proposal of a model for the conduction mechanism of the B-mode stress-induced leakage current (B-SILC); Function of B-SILC; Discussion on the empirical expression for the current-voltage characteristics of the B-SILC.
- Subjects :
- *HOPPING conduction
*SILICA
Subjects
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 70
- Issue :
- 3
- Database :
- Academic Search Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 4187116
- Full Text :
- https://doi.org/10.1063/1.118411