Back to Search
Start Over
Development of preferred orientation in polycrystalline TiN layers grown by ultrahigh vacuum....
- Source :
-
Applied Physics Letters . 11/13/1995, Vol. 67 Issue 20, p2928. 3p. 2 Color Photographs, 3 Graphs. - Publication Year :
- 1995
-
Abstract
- Examines the preferred orientation of polycrystalline TiN films grown by ultrahigh-vacuum reactive-magnetron sputtering. Function of TiN films deposition of reactive magnetron sputtering; Importance of the presence of large intrinsic film stresses in determining TiN preferred orientation; Variety of kinetic effects associated with growth process.
- Subjects :
- *POLYCRYSTALS
*ULTRAHIGH vacuum
*SPUTTERING (Physics)
Subjects
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 67
- Issue :
- 20
- Database :
- Academic Search Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 4177814
- Full Text :
- https://doi.org/10.1063/1.114845