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Development of preferred orientation in polycrystalline TiN layers grown by ultrahigh vacuum....

Authors :
Greene, J.E.
Sundgren, J.-E.
Source :
Applied Physics Letters. 11/13/1995, Vol. 67 Issue 20, p2928. 3p. 2 Color Photographs, 3 Graphs.
Publication Year :
1995

Abstract

Examines the preferred orientation of polycrystalline TiN films grown by ultrahigh-vacuum reactive-magnetron sputtering. Function of TiN films deposition of reactive magnetron sputtering; Importance of the presence of large intrinsic film stresses in determining TiN preferred orientation; Variety of kinetic effects associated with growth process.

Details

Language :
English
ISSN :
00036951
Volume :
67
Issue :
20
Database :
Academic Search Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
4177814
Full Text :
https://doi.org/10.1063/1.114845