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Importance of channeled implantation to the synthesis of erbium silicide layers.

Authors :
Wu, M.F.
Vantomme, A.
Source :
Applied Physics Letters. 12/25/1995, Vol. 67 Issue 26, p3886. 3p. 1 Chart, 3 Graphs.
Publication Year :
1995

Abstract

Examines the significance of channeled implantation in the synthesis of erbium silicide layers. Range of temperatures and energy used in the deposition; Formation of good crystalline quality of the continuous epitaxial erbium silicide layer; Energy level of ion beam synthesis.

Details

Language :
English
ISSN :
00036951
Volume :
67
Issue :
26
Database :
Academic Search Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
4177251
Full Text :
https://doi.org/10.1063/1.115306