Back to Search
Start Over
Multiple-crystal x-ray topographic characterization of periodically domain-inverted....
- Source :
-
Applied Physics Letters . 1/2/1995, Vol. 66 Issue 1, p13. 3p. 5 Black and White Photographs. - Publication Year :
- 1995
-
Abstract
- Examines the characterization of periodically domain inverted KTiOPO[sub 4] crystal by a multiple reflection x-ray topography. Discussion of the origin of striation contrast formation and the mechanism of KTIOPO[sub 4] domain; Application of multi crystal multiple reflection high resolution x-ray topography; Disclosure of striation contrast.
- Subjects :
- *CRYSTALS spectra
*OPTICAL reflection
Subjects
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 66
- Issue :
- 1
- Database :
- Academic Search Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 4167637
- Full Text :
- https://doi.org/10.1063/1.114165