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High quality, large surface area, homoepitaxial MPACVD diamond growth

Authors :
Silva, F.
Achard, J.
Brinza, O.
Bonnin, X.
Hassouni, K.
Anthonis, A.
De Corte, K.
Barjon, J.
Source :
Diamond & Related Materials. May2009, Vol. 18 Issue 5-8, p683-697. 15p.
Publication Year :
2009

Abstract

Abstract: The use of CVD diamond in electronics has very stringent requirements. For a CVD diamond industry to become viable it is mandatory to obtain very large growth rates (>5 µm/h), all the while maintaining extremely high purity, a crystalline defect density as low as possible, and large usable surface areas. At the same time, one must keep the stress level within the growing crystal below acceptable limits to avoid crack formation and preserve the crystal structural integrity. These imperatives imply to work to improve both the plasma deposition process and the CVD diamond crystal growth. In this paper, we propose a three-pronged approach: (i) We use detailed plasma models to establish the influence of process parameters (in particular deposition pressure) on plasma chemistry in order to optimize film growth rate and diamond quality; (ii) We emphasize the need for careful substrate pre-treatment and selection (including choosing a single-sector face) to minimize defects in the growing films; (iii) We employ a 3D geometrical model to predict the crystal shape under given growth conditions, and exploit this knowledge to devise a growth strategy maximizing the usable film surface area while minimizing stresses inside the films. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
09259635
Volume :
18
Issue :
5-8
Database :
Academic Search Index
Journal :
Diamond & Related Materials
Publication Type :
Academic Journal
Accession number :
41241448
Full Text :
https://doi.org/10.1016/j.diamond.2009.01.038