Evaluation of Y2O3 gate insulators for a-IGZO thin film transistors

MLA

Cho, Young-Je, et al. “Evaluation of Y2O3 Gate Insulators for A-IGZO Thin Film Transistors.” Thin Solid Films, vol. 517, no. 14, May 2009, pp. 4115–18. EBSCOhost, https://doi.org/10.1016/j.tsf.2009.02.020.

APA

Cho, Y.-J., Shin, J.-H., Bobade, S. M., Kim, Y.-B., & Choi, D.-K. (2009). Evaluation of Y2O3 gate insulators for a-IGZO thin film transistors. Thin Solid Films, 517(14), 4115–4118. https://doi.org/10.1016/j.tsf.2009.02.020

Chicago

Cho, Young-Je, Ji-Hoon Shin, S.M. Bobade, Young-Bae Kim, and Duck-Kyun Choi. 2009. “Evaluation of Y2O3 Gate Insulators for A-IGZO Thin Film Transistors.” Thin Solid Films 517 (14): 4115–18. doi:10.1016/j.tsf.2009.02.020.