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OPTIMAL IMPORTANCE SAMPLING PARAMETER SEARCH FOR LÉVY PROCESSES VIA STOCHASTIC APPROXIMATION.

Authors :
Kawai, Reiichiro
Source :
SIAM Journal on Numerical Analysis. 2009, Vol. 47 Issue 1, p293-307. 15p. 2 Graphs.
Publication Year :
2009

Abstract

The author proposes stochastic approximation methods of finding the optimal measure change by the exponential tilting for Lévy processes in Monte Carlo importance sampling variance reduction. In accordance with the structure of the underlying Lévy measure, either a constrained or unconstrained algorithm of the stochastic approximation is chosen. For both cases, the almost sure convergence to a unique stationary point is proved. Numerical examples are presented to illustrate the effectiveness of our method. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00361429
Volume :
47
Issue :
1
Database :
Academic Search Index
Journal :
SIAM Journal on Numerical Analysis
Publication Type :
Academic Journal
Accession number :
39343465
Full Text :
https://doi.org/10.1137/070680564