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Neural networks for HREM image analysis.

Authors :
Kirschner, Holger
Hillebrand, Reinald
Source :
Information Sciences. Nov2000, Vol. 129 Issue 1-4, p31. 12p. 10 Diagrams, 1 Chart, 1 Graph.
Publication Year :
2000

Abstract

Presents a study which presented a neural network-based method of image processing for determining the local composition and thickness of III-V semiconductors in high resolution electron microscope (HREM) images. Description of HREM images; Analysis of the neural network-based method; Experimental results; Conclusion.

Subjects

Subjects :
*ARTIFICIAL neural networks
*IMAGE processing
*HIGH resolution spectroscopy

Details

Language :
English
ISSN :
00200255
Volume :
129
Issue :
1-4
Database :
Academic Search Index
Journal :
Information Sciences
Publication Type :
Periodical
Accession number :
3914847
Full Text :
https://doi.org/10.1016/S0020-0255(00)00067-0
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