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Shrinking solid-state nanopores using electron-beam-induced deposition.

Authors :
Ronald Kox
Chang Chen
Guido Maes
Liesbet Lagae
Gustaaf Borghs
Source :
Nanotechnology. Mar2009, Vol. 20 Issue 11, p15302-15302. 1p.
Publication Year :
2009

Abstract

Solid-state nanopores of only a few nanometres in size show a great potential for applications such as molecule detection and DNA sequencing. In most cases, the fabrication of such a nanopore requires the high energy beam of a transmission electron microscope (TEM) or focused ion beam (FIB) tool to drill or reshape a small hole in a freestanding membrane. Here, we present a novel method to reduce the size of existing nanopores using electron-beam-induced deposition (EBID) of carbon in a conventional scanning electron microscope (SEM). The existing nanopores are etched in a silicon membrane using anisotropic wet etching and can be shrunk down to a few nanometres using EBID. This paper discusses the parameters that influence the rate of shrinking and provides an insight into the underlying mechanism. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
09574484
Volume :
20
Issue :
11
Database :
Academic Search Index
Journal :
Nanotechnology
Publication Type :
Academic Journal
Accession number :
36651796
Full Text :
https://doi.org/10.1088/0957-4484/20/11/115302