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Near-field modal microscopy of subwavelength light confinement in multimode silicon slot waveguides.
- Source :
-
Applied Physics Letters . 12/22/2008, Vol. 93 Issue 25, p251103. 3p. 2 Charts, 3 Graphs. - Publication Year :
- 2008
-
Abstract
- Silicon-on-insulator slot waveguides are studied by scanning near-field optical microscopy. Images of the standing wave pattern were established experimentally and compared with numerical simulations. Fourier analysis along the propagation direction reveals noticeable frequencies both on the experiment and the computation that could be related not only to the guided mode but also to beating phenomena between the coupled waveguides. Finally, light confinement above the slot is directly visualized with a subwavelength resolution and is compared with the expected field distribution. [ABSTRACT FROM AUTHOR]
- Subjects :
- *WAVEGUIDES
*NEAR-field microscopy
*ELECTRICAL conductors
*ELECTRIC waves
*PHYSICS
Subjects
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 93
- Issue :
- 25
- Database :
- Academic Search Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 36197983
- Full Text :
- https://doi.org/10.1063/1.3040012