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ATE Platform Tests Both Flash and DRAM.
- Source :
-
EE: Evaluation Engineering . Jan2009, Vol. 48 Issue 1, p12-12. 1/3p. - Publication Year :
- 2009
-
Abstract
- The article evaluates the V6000 test system from Verigy.
- Subjects :
- *TEST systems
*ENGINEERING equipment
Subjects
Details
- Language :
- English
- ISSN :
- 01490370
- Volume :
- 48
- Issue :
- 1
- Database :
- Academic Search Index
- Journal :
- EE: Evaluation Engineering
- Publication Type :
- Periodical
- Accession number :
- 36048402