Electrical and mechanical properties of diluted magnetic semiconductor Zn1− x Mn x S nanocrystalline films

Abstract: Nanostructured Zn1− x Mn x S films (0⩽ x ⩽0.25) were deposited on glass substrates by simple resistive thermal evaporation technique. All the films were deposited at 300K in a vacuum of 2×10−6 m bar. All the films temperature dependence of resistivity revealed semiconducting behaviour of the samples. Hot probe test revealed that all the samples exhibited n-type conductivity. The nanohardness of the films ranges from 4.7 to 9.9GPa, Young’s modulus value ranging 69.7–94.2GPa. [Copyright &y& Elsevier]