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Transmission electron microscopy structure and platinum-like temperature coefficient...
- Source :
-
Journal of Applied Physics . 7/15/2000, Vol. 88 Issue 2, p1124. 5p. 4 Diagrams, 1 Chart, 1 Graph. - Publication Year :
- 2000
-
Abstract
- Discusses thick film resistors as an alternative to thin-film platinum temperature sensors. Resistance and resistivity; Transmission electron microscopy characterization; Microscopic composition and crystallography; Role of morphology on temperature coefficient resistance.
- Subjects :
- *THICK films
*FILM resistors
*THIN films
Subjects
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 88
- Issue :
- 2
- Database :
- Academic Search Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 3485517
- Full Text :
- https://doi.org/10.1063/1.373786