Birefringence measurements of MnPc thin film by polarization microscopy

Authors :: Hashimoto, T.
Kaito, T.
Yanagiya, S.
Mori, A.
Goto, N.
Source :: Applied Surface Science. Sep2008, Vol. 254 Issue 23, p7947-7949. 3p.
Publication Year :: 2008
Abstract: Abstract: We have studied optical properties of near-infrared (NIR) spectra and birefringence of the manganese phthalocyanine (MnPc) thin films. The morphology of the MnPc thin film grown on KCl (001) substrates was observed by using an atomic force microscope. The NIR spectral range of 1.0–1.7μm was studied in this study, because that of 1.3–1.5μm is known as an optical communication wavelength. The birefringence was measured with changing the growth condition of a deposition rate and a substrate temperature. The birefringence of the film was most affected by the deposition rate. [Copyright &y& Elsevier]