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Virtual charge method for electrostatic calculations in metallic tip and semiconducting sample...

Authors :
De la Broïse, X.
Lannoo, M.
Delerue, C.
Source :
Journal of Applied Physics. 12/1/1997, Vol. 82 Issue 11, p5589. 8p. 10 Graphs.
Publication Year :
1997

Abstract

Calculates the electric field between the metallic tip and a semiconductor surface. Replacement of the electrodes by a set of virtual charges; Adjusting to fit the boundary conditions on the surfaces; Result of a direct integration of the Poisson equation; Comparison with the result of a one-dimensional model; Theory of near field microscopy.

Details

Language :
English
ISSN :
00218979
Volume :
82
Issue :
11
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
34141