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System approach to metrology of quantum multiparticle systems.
- Source :
-
Measurement Techniques . Apr2008, Vol. 51 Issue 4, p345-350. 6p. - Publication Year :
- 2008
-
Abstract
- Abstract  Features of the metrology of quantum multiparticle systems in connection with general system theory and representational theory are considered. Quantitative characteristics of the periodic system of elements (PSE) are introduced and studied, including property correlation, and also system hierarchies are considered leading to its analysis and possible application of nanosystems and quantum computers. [ABSTRACT FROM AUTHOR]
- Subjects :
- *QUANTUM computers
*COMPUTERS
*QUANTUM computer peripherals
*SYSTEMS theory
Subjects
Details
- Language :
- English
- ISSN :
- 05431972
- Volume :
- 51
- Issue :
- 4
- Database :
- Academic Search Index
- Journal :
- Measurement Techniques
- Publication Type :
- Academic Journal
- Accession number :
- 34119327
- Full Text :
- https://doi.org/10.1007/s11018-008-9043-z